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Microelectronics Reliability

ISSN 0026-2714Active
Official Website
Publisher
Elsevier Ltd
Country
United Kingdom
Subject Areas
Atomic and Molecular Physics, and OpticsCondensed Matter PhysicsElectrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsSafety, Risk, Reliability and QualitySurfaces, Coatings and Films

Indexing & Recognition

Data sourced from official lists. Always cross-verify with the primary indexing database.

Scopus
Source: Scopus Source List
ListedQuartile Q2 · H-Index 115 · Coverage 1962–2026
Last verified: 4 Jun 2026
Web of Science
Source: Web of Science Master Journal List
ListedSCIE
Last verified: 9 Jun 2026
ABDC
Not listed
DOAJ
Not listed

Verification Sources

This record was compiled from the following sources. Data may not reflect real-time changes — always verify with the primary source.

Scopus Source ListVisit →
Web of Science Master Journal ListVisit →

Data is provided for informational purposes only and may be outdated — always verify with the primary source before submitting. Academint is not affiliated with these providers. Sources & attribution →

Record last updated: 9 June 2026

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